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In-situ TEM Probing of Ferroelectric Domain Switching
- Title
- In-situ TEM Probing of Ferroelectric Domain Switching
- Date Issued
- 2011-05-25
- Publisher
- International Union of Microbeam Analysis Societies
- Article Type
- Conference
- Citation
- 5th Congress of the International Union of Microbeam Analysis Societies, 2011-05-25
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Related Researcher
- 오상호OH, SANG HO
- Dept of Materials Science & Enginrg