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In-situ TEM Probing of Ferroelectric Domain Switching

Title
In-situ TEM Probing of Ferroelectric Domain Switching
Authors
오상호신가영이호녕구길호
POSTECH Authors
오상호
Date Issued
25-May-2011
Publisher
International Union of Microbeam Analysis Societies
URI
http://oasis.postech.ac.kr/handle/2014.oak/61169
Article Type
Conference
Citation
5th Congress of the International Union of Microbeam Analysis Societies, 2011-05-25
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오상호OH, SANG HO
Dept of Materials Science & Enginrg
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