In-situ TEM Probing of Ferroelectric Domain Switching
- In-situ TEM Probing of Ferroelectric Domain Switching
- 오상호; 신가영; 이호녕; 구길호
- POSTECH Authors
- Date Issued
- International Union of Microbeam Analysis Societies
- Article Type
- 5th Congress of the International Union of Microbeam Analysis Societies, 2011-05-25
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