Indium composition fluctuation in InGaN well layer of LED devices analyzed by APT and STEM-EELS
- Title
- Indium composition fluctuation in InGaN well layer of LED devices analyzed by APT and STEM-EELS
- Authors
- 박찬경; 구길호; 이봉호
- Date Issued
- 2011-05-22
- Publisher
- Congress of the International Union of Microbeam Analysis Societies
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/60915
- Article Type
- Conference
- Citation
- 5th Congress of the International Union of Microbeam Analysis Societies(IUMAS-V), 2011-05-22
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- There are no files associated with this item.
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