Analysis of carrier trapping of hydroxyl group on OFET by using gate bias stress
- Analysis of carrier trapping of hydroxyl group on OFET by using gate bias stress
- 박찬언; 김지예; 김세현; 박미정; 박선욱
- POSTECH Authors
- Date Issued
- Article Type
- 2011 추계학술대회, 2011-10-06
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