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Analysis of carrier trapping of hydroxyl group on OFET by using gate bias stress

Title
Analysis of carrier trapping of hydroxyl group on OFET by using gate bias stress
Authors
박찬언김지예김세현박미정박선욱
POSTECH Authors
박찬언
Date Issued
6-Oct-2011
Publisher
한국고분자학회
URI
http://oasis.postech.ac.kr/handle/2014.oak/60716
Article Type
Conference
Citation
2011 추계학술대회, 2011-10-06
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박찬언PARK, CHAN EON
Dept. of Chemical Enginrg
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