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Analysis of carrier trapping of hydroxyl group on OFET by using gate bias stress
- Title
- Analysis of carrier trapping of hydroxyl group on OFET by using gate bias stress
- Date Issued
- 2011-10-06
- Publisher
- 한국고분자학회
- Article Type
- Conference
- Citation
- 2011 추계학술대회, 2011-10-06
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Related Researcher
- 박찬언PARK, CHAN EON
- Dept. of Chemical Enginrg