Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Quantitative Atomic-Scale Analysis of Interface Structure of CoSi2 on polycrystalline and single crystalline silicon using by STEM-HAADF and 3D-AP
- Title
- Quantitative Atomic-Scale Analysis of Interface Structure of CoSi2 on polycrystalline and single crystalline silicon using by STEM-HAADF and 3D-AP
- Date Issued
- 2008-09-02
- Publisher
- IUCr
- Article Type
- Conference
- Citation
- International Union of Crystallography, 2008-09-02
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg