Quantitative Atomic-Scale Analysis of Interface Structure of CoSi2 on polycrystalline and single crystalline silicon using by STEM-HAADF and 3D-AP
- Title
- Quantitative Atomic-Scale Analysis of Interface Structure of CoSi2 on polycrystalline and single crystalline silicon using by STEM-HAADF and 3D-AP
- Authors
- 박찬경; 구길호; 이한보람; 김형준
- Date Issued
- 2008-09-02
- Publisher
- IUCr
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/52199
- Article Type
- Conference
- Citation
- International Union of Crystallography, 2008-09-02
- Files in This Item:
- There are no files associated with this item.
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