SkSP-R sampling plan based on process capability index

Abstract

In this paper, we present an optimal designing methodology for the skip-lot sampling plan (SkSP) of type SkSP-R based on the most widely used process capability index (PCI) Cpk. The SkSP-R plan is one of the SkSPs that incorporate the provision of the reinspection concept. In order to design the optimal parameters, we consider both symmetric and asymmetric fraction non conforming cases. Tables are also constructed to determine the optimal parameters by formulating an optimization problem. The advantages of the proposed plan over the existing plan are also discussed. Application of the plan is explained with a real-life example. ? 2017 Taylor & Francis Group, LLC.