Group SkSP-R sampling plan for accelerated life tests

Abstract

This study presents a group skip-lot sampling plan using resampling (SkSP-R) for accelerated life tests. It is assumed that the lifetime of a product follows Weibull distribution with known shape parameter under the use condition, while the scale parameter can be obtained from acceleration factor. The plan parameters are determined through a non-linear optimisation problem for fixed values of producer's risk and consumer's risk. The advantages of the proposed plan over the existing one are explained with some practical examples.