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Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress
- Title
- Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress
- Date Issued
- 2011-02-16
- Publisher
- 대한전자공학회
- Article Type
- Conference
- Citation
- 18th Korean Conference on Semiconductors (2011), 2011-02-16
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg