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Atomic force microscopy: measuring telomere lengeh of chromosome
- Title
- Atomic force microscopy: measuring telomere lengeh of chromosome
- Authors
- 박수현
- Date Issued
- 2016-08-24
- Publisher
- The Korean Vacuum Society
- Article Type
- Conference
- Citation
- 20th International VACUUM CONGRESS / IVC-20, 2016-08-24
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Related Researcher
- 박준원PARK, JOON WON
- Dept of Chemistry