A Novel Series-resistance Extraction Method for Nano-scaled nMOSFETs Considering Mobility Degradation due to Vbs
- Title
- A Novel Series-resistance Extraction Method for Nano-scaled nMOSFETs Considering Mobility Degradation due to Vbs
- Authors
- 백록현; 최길복; 강희성; 정성우; 정윤하
- Date Issued
- 2008-10-20
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/49496
- Article Type
- Conference
- Citation
- IEEE Nanotechnology Materials and Devices Conference (NMDC2008), 2008-10-20
- Files in This Item:
- There are no files associated with this item.
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