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RF and Hot Carrier Effects in metal gate/high-k Dielectric nMOSFETs at cryogenic temperature
- Title
- RF and Hot Carrier Effects in metal gate/high-k Dielectric nMOSFETs at cryogenic temperature
- Date Issued
- 2009-04-26
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE IRPS(2009), 2009-04-26
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg