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Characteristics of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects
- Title
- Characteristics of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects
- Date Issued
- 2010-05-02
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE IRPS(2010), 2010-05-02
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg