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C-V Characteristics and Analysis of Undoped Gate-All-Around Nanowire FET Array
- Title
- C-V Characteristics and Analysis of Undoped Gate-All-Around Nanowire FET Array
- Date Issued
- 2010-09-21
- Publisher
- The Japan Society of Applied Physics
- Article Type
- Conference
- Citation
- Solid State Devices and Materials (SSDM2010), page. 1277 - 1278, 2010-09-21
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg