Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique
- Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique
- 백록현; 김예람; 이상현; 백창기; 여경환; 김동원; 이정수; 정윤하
- POSTECH Authors
- Date Issued
- Article Type
- IEEE Nanotechnology Materials and Devices Conference (NMDC2011), 2011-10-19
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