Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Effects of fin height of tapered FinFETs on the sub-22nm System on Chip (SoC) application using TCAD simulation
- Title
- Effects of fin height of tapered FinFETs on the sub-22nm System on Chip (SoC) application using TCAD simulation
- Date Issued
- 2013-04-22
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE VLSI-TSA (2013), 2013-04-22
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg