Channel with dependence of AC stress on bulk nMOSFETs
- Title
- Channel with dependence of AC stress on bulk nMOSFETs
- Authors
- 강봉구; 손동희; 서지훈; 김강준
- Date Issued
- 2016-09-21
- Publisher
- Microelectronics Reliability
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/48713
- Article Type
- Conference
- Citation
- ESREF 2016(the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2016-09-21
- Files in This Item:
- There are no files associated with this item.
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