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Channel with dependence of AC stress on bulk nMOSFETs
- Title
- Channel with dependence of AC stress on bulk nMOSFETs
- Date Issued
- 2016-09-21
- Publisher
- Microelectronics Reliability
- Article Type
- Conference
- Citation
- ESREF 2016(the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2016-09-21
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Related Researcher
- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg