Characterization and local structure analysis of carbon coated SiOx using confocal μ-Raman microscopy
- Title
- Characterization and local structure analysis of carbon coated SiOx using confocal μ-Raman microscopy
- Authors
- 강병우; 김정한
- Date Issued
- 2016-10-05
- Publisher
- The Electrochemical Society
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/48657
- Article Type
- Conference
- Citation
- PRIME 2016, 2016-10-05
- Files in This Item:
- There are no files associated with this item.
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