Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Characterization of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects
- Title
- Characterization of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects
- Authors
- 이정수
- Date Issued
- 2010-05-06
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE International Reliability Physics Symposium, 2010-05-06
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg