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Reliability properties in sub-50 nm high performance high-k.metal gate stacks SiGe pMOSFETs
- Title
- Reliability properties in sub-50 nm high performance high-k.metal gate stacks SiGe pMOSFETs
- Authors
- 이정수
- Date Issued
- 2010-10-12
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE Nanotechnology Materials and Devices conference, 2010-10-12
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Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg