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Evidence of band bending at the surface of p-type GaN measured by synchrotron radiation photoemission spectroscopy
- Title
- Evidence of band bending at the surface of p-type GaN measured by synchrotron radiation photoemission spectroscopy
- Authors
- 김종규; Jong-Lam Lee; J. W. Lee; Y. Park; T. Kim; K.-J. Kim; B. Kim; S. W. Ryu; C. Jeon; S. Y. Han; Y -H. Cho; J. H. Je
- Date Issued
- 2000-06-21
- Publisher
- 42nd 2000 Electronic Materials Conference
- Article Type
- Conference
- Citation
- 42nd 2000 Electronic Materials Conference, 2000-06-21
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