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Grazing-Incidence X-Ray Diffraction Studies on Polymer Semiconductors: Relationship between Polymer Microstructures and Electrical Performance
- Title
- Grazing-Incidence X-Ray Diffraction Studies on Polymer Semiconductors: Relationship between Polymer Microstructures and Electrical Performance
- Authors
- OH, JOON HAK
- Date Issued
- 2017-07-12
- Publisher
- The International Conference on Neutron Scattering 2017 (ICNS 2017)
- Article Type
- Conference
- Citation
- The International Conference on Neutron Scattering 2017 (ICNS 2017), 2017-07-12
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Related Researcher
- 오준학OH, JOON HAK
- Dept. of Chemical Enginrg