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The identification of 3-D In inclusion for the high-efficiency InGaN based multi quantum well light emitting diode by using atom probe tomography and HR-STEM
- Title
- The identification of 3-D In inclusion for the high-efficiency InGaN based multi quantum well light emitting diode by using atom probe tomography and HR-STEM
- Date Issued
- 2009-04-23
- Publisher
- 대한재료금속학회
- Article Type
- Conference
- Citation
- 대한재료금속학회 춘계학술대회, 2009-04-23
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg