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Article
Robust Level Converter for Sub-Threshold/Super-Threshold Operation: 100 mV to 2.5 VSCIESCOPUS

IEEE Trans. on VLSI Systems, vol. 19, no. 8, page. 1429 - 1437, 2011-08

Article
SRAM Write-Ability Improvement with Transient Negative Bit-Line VoltageSCIESCOPUS

IEEE Trans. on VLSI Systems, vol. 19, no. 1, page. 24 - 32, 2011-01

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