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Department of Electrical Engineering (전자전기공학과)
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Conference
PBTI and HCI stress-induces trap generation in SiO2/HfO2 gate stack NMOSFETs and its impact on low frequency noise
ISAGST 2008, 2008-09-29
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강창용
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최현식
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홍승호
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최길복
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김재철
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송승현
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박민상
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사공현철
;
사공성환
;
이병훈
;
G. Bersuker
;
H. H. Tseng
;
R. Jammy
;
정윤하
Conference
New multi frequency capacitance extraction methodology for leaky MOS capacitor with High-K dielectric and metal gate
ISAGST 2008, 2008-09-29
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김재철
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사공현철
;
강창용
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이병훈
;
G. Bersuker
;
H. H. Tseng
;
R. Jammy
;
정성우
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정윤하
Conference
Cryogenic RF Characteristics of HfO2-Gated nMOSFET
ISAGST 2008, 2008-09-29
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홍승호
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김재철
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사공현철
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정성우
;
강창용
;
G. Bersuker
;
H. H. Tseng
;
R. Jammy
;
이병훈
;
정윤하
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