Critical assessment of charge mobility extraction in FETs
SCIE
SCOPUS
- Title
- Critical assessment of charge mobility extraction in FETs
- Authors
- CHOI, HYUN HO; CHO, KIL WON; PODZOROV, VITALY; FRISBIE, C. DANIEL; SIRRINGHAUS, HENNING
- Date Issued
- 2018-01
- Publisher
- NATURE PUBLISHING GROUP
- Abstract
- Mobility is an important charge-transport parameter in organic, inorganic and hybrid semiconductors. We outline some of the common pitfalls of mobility extraction from field-effect transistor (FET) measurements and propose practical recommendations to avoid reporting erroneous mobilities in publications.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/41039
- DOI
- 10.1038/nmat5035
- ISSN
- 1476-1122
- Article Type
- Article
- Citation
- NATURE MATERIALS, vol. 17, page. 2 - 7, 2018-01
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- There are no files associated with this item.
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