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Article
CHANGE OF THE CRITICAL THICKNESS IN THE PREFERRED ORIENTATION OF TIN FILMSSCIESCOPUS

JOURNAL OF MATERIALS RESEARCH, vol. 10, no. 3, page. 634 - 639, 1995-03

Article
Preferred orientation of TiN films studied by a real time synchrotron x-ray scatteringSCIESCOPUS

JOURNAL OF APPLIED PHYSICS, vol. 81, no. 9, page. 6126 - 6133, 1997-05-01

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