Accelerated lifetime test based on general electrical principles for light-emitting electrochemical cells
SCIE
SCOPUS
- Title
- Accelerated lifetime test based on general electrical principles for light-emitting electrochemical cells
- Authors
- Jin Hyuk Jang; Lae Ho Kim; Yong Jin Jeong; Kyunghun Kim; Tae Kyu An; Se Hyun Kim; Park, CE
- Date Issued
- 2016-07
- Publisher
- Elsevier
- Abstract
- We report the use of a straightforward alternative accelerated lifetime test (ALT) method, derived from general electrical principles, for estimating how encapsulated light-emitting electrochemical cells (LECs) operate in ambient conditions. The LECs that we tested were made with poly(2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene) (MEH-PPV), poly(ethylene oxide) (PEO), trifluoromethanesulfonate (KCF3SO3) and PEDOT:PSS. These LECs were fabricated by using a common method that is described in published investigations of operational lifetime. The method we developed used only a single data point originating from a high level of current density, and could predict the operational lifetimes of the encapsulated LECs to within a margin of error of less than 4% in this system. (C) 2016 Elsevier B.V. All rights reserved.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/37744
- DOI
- 10.1016/J.ORGEL.2016.04.003
- ISSN
- 1566-1199
- Article Type
- Article
- Citation
- Organic Electronics, vol. 34, page. 50 - 56, 2016-07
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- There are no files associated with this item.
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