Principles and Applications of Force Spectroscopy Using Atomic Force Microscopy
SCIE
SCOPUS
KCI
- Title
- Principles and Applications of Force Spectroscopy Using Atomic Force Microscopy
- Authors
- Kim, Y; Kim, W; Park, J.W.
- Date Issued
- 2016-12
- Publisher
- wiley
- Abstract
- Single-molecule force spectroscopy is a powerful technique for addressing single molecules. Unseen structures and dynamics of molecules have been elucidated using force spectroscopy. Atomic force microscope (AFM)-based force spectroscopy studies have provided picoNewton force resolution, subnanometer spatial resolution, stiffness of substrates, elasticity of polymers, and thermodynamics and kinetics of single-molecular interactions. In addition, AFM has enabled mapping the distribution of individual molecules in situ, and the quantification of single molecules has been made possible without modification or labeling. In this review, we describe the basic principles, sample preparation, data analysis, and applications of AFM-based force spectroscopy and its future.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/37425
- DOI
- 10.1002/BKCS.11022
- ISSN
- 0253-2964
- Article Type
- Article
- Citation
- BULLETIN OF THE KOREAN CHEMICAL SOCIETY, vol. 37, no. 12, page. 1895 - 1907, 2016-12
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.