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Cited 14 time in webofscience Cited 16 time in scopus
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Precise measurement of orientations of transparent ellipsoidal particles through digital holographic microscopy SCIE SCOPUS

Title
Precise measurement of orientations of transparent ellipsoidal particles through digital holographic microscopy
Authors
Byeon, HGo, TLee, SJ
Date Issued
2016-01-11
Publisher
OPTICAL SOC AMER
Abstract
A method to measure the orientations of transparent ellipsoidal particles using digital holographic microscopy (DHM) is proposed in this study. This approach includes volumetric recording and numerical reconstruction at different depths. Distinctive light scatterings from an ellipsoid with different angles of orientation are analyzed. A focus function is applied to obtain a reconstructed image that contains a bright line parallel to the major axis of the projected particle, which provides in-plane orientation information. An intensity profile is collected along the major axis of the projected particle in the direction of the optical axis, and this profile is then utilized to measure the out-of-plane orientation of the ellipsoid. After being verified for an ellipsoid with known orientations, the proposed method is applied to ellipsoids suspended in a pipe flow with random orientations. This DHM method can extract the essential information of ellipsoids and therefore has great potential applications in particle dynamics. (C) 2016 Optical Society of America
URI
https://oasis.postech.ac.kr/handle/2014.oak/37312
DOI
10.1364/OE.24.000598
ISSN
1094-4087
Article Type
Article
Citation
Optics Express, vol. 24, no. 1, page. 598 - 610, 2016-01-11
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이상준LEE, SANG JOON
Dept of Mechanical Enginrg
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