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Thickness-dependent electronic structure in ultrathin LaNiO3 films under tensile strain SCIE SCOPUS

Title
Thickness-dependent electronic structure in ultrathin LaNiO3 films under tensile strain
Authors
Hyang Keun YooSeung Ill HyunYoung Jun ChangLuca MoreschiniChang Hee SohnHyeong-Do KimAARON BOSTWICKELI ROTENBERGShim, JHTae Won Noh
Date Issued
2016-01-29
Publisher
AMER PHYSICAL SOC
Abstract
We investigated electronic-structure changes of tensile-strained ultrathin LaNiO3 (LNO) films from ten to one unit cells (UCs) using angle-resolved photoemission spectroscopy (ARPES). We found that there is a critical thickness t(c) between four and three UCs below which Ni e(g) electrons are confined in two-dimensional space. Furthermore, the Fermi surfaces (FSs) of LNO films below t(c) consist of two orthogonal pairs of one-dimensional (1D) straight parallel lines. Such a feature is not accidental as observed in constant-energy surfaces at all binding energies, which is not explained by first-principles calculations or the dynamical mean-field theory. The ARPES spectra also show anomalous spectral behaviors, such as no quasiparticle peak at the Fermi momentum but fast band dispersion comparable to the bare-band one, which is typical in a 1D system. As its possible origin, we propose 1D FS nesting, which also accounts for FS superstructures observed in ARPES.
URI
https://oasis.postech.ac.kr/handle/2014.oak/36615
DOI
10.1103/PHYSREVB.93.035141
ISSN
2469-9950
Article Type
Article
Citation
Physical Review b, vol. 93, no. 3, page. 35141-1 - 35141-7, 2016-01-29
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심지훈SHIM, JI HOON
Dept of Chemistry
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