Analysis of Far-Out Spurious Noise and its Reduction in Envelope-Tracking Power Amplifier
SCIE
SCOPUS
- Title
- Analysis of Far-Out Spurious Noise and its Reduction in Envelope-Tracking Power Amplifier
- Authors
- Jooseung Kim; Dongsu Kim; Yunsung Cho; Daehyun Kang; Byungjoon Park; Kyunghoon Moon; Kim, B
- Date Issued
- 2015-12
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Abstract
- This paper describes analysis of the far-out spurious noise and a method to reduce this noise in an envelope-tracking power amplifier (ET PA). The ET PA delivers a higher efficiency and a better linearity than the stand-alone PA, simultaneously. However, the ET PA generates spectral regrowth at a far-out spurious emission domain. The noise sources are analyzed, and the noise effects on a RF PA are estimated using mathematical models of the RF PA and supply modulator. To reduce the noise, a wideband supply modulator is designed using 40-nm CMOS process for a high speed operation, and an additional capacitor is connected to the supply line of the PA. These noise reduction techniques significantly reduce the far-out spurious noise of the ET PA to a level similar to that of the stand-alone PA. For a 10-MHz bandwidth and 6.5-dB peak-to-average power ratio long term evolution signal, the ET PA delivers a power-added efficiency of 41.8%, a gain of 23.8 dB, and an evolved universal terrestrial radio access adjacent channel leakage ratio of -34.3 dBc at an average output power of 27 dBm and an operating frequency of 1.85 GHz. The noise power spectrum densities of the ET PA are -130.3/ - 133.7 dBm/Hz at 1.93/1.99 GHz, respectively, which is limited by our PA itself.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/36169
- DOI
- 10.1109/TMTT.2015.2495178
- ISSN
- 0018-9480
- Article Type
- Article
- Citation
- IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. 63, no. 12, page. 4072 - 4082, 2015-12
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