A scanning photoelectron microscope for materials science spectromicroscopy at the Pohang Light Source
SCIE
SCOPUS
- Title
- A scanning photoelectron microscope for materials science spectromicroscopy at the Pohang Light Source
- Authors
- Shin, HJ; Lee, MK; Kim, GB; Hong, CK; Lee, JY; Kim, JW; Park, SM; Roh, YS; Jeong, K
- Date Issued
- 2003-03
- Publisher
- E D P SCIENCES
- Abstract
- A Fresnel zone plate based SPEM (scanning photoelectron microscope) is in operation at the Pohang Light Source. Space resolution of the SPEM is typically less than or similar to 1 mum (0.4 mum in the best resolution) and the photon flux at the focused spot is similar to10(9) photons/s. The SPEM is working in the energy range between 400 and 1,000 eV. In taking images and spectra, the SPEM detects photoelectrons from the focused spot using a hemispherical analyzer with 16-channel detection capability at energy resolution of similar to 0.5 eV The SPEM also measures sample current, with which comparative x-ray absorption micro-spectroscopy is available in limited energy range with spectral resolving power (E/DeltaE) of similar to 3,000. The advantage of detecting sample current image and x-ray absorption spectrum at the Fe L-III-edge is demonstrated for understanding the effect of electrochemically deposited Zn layer on Fe substrate.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/33717
- DOI
- 10.1051/JP4:20030003
- ISSN
- 1155-4339
- Article Type
- Article
- Citation
- JOURNAL DE PHYSIQUE IV, vol. 104, page. 67 - 70, 2003-03
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- There are no files associated with this item.
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