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A structural characterization of AlN thin film deposited on a single crystal Al2O3(0001) substrate SCIE SCOPUS
- Title
- A structural characterization of AlN thin film deposited on a single crystal Al2O3(0001) substrate
- Date Issued
- 1997-09-01
- Publisher
- CHAPMAN HALL LTD
- Keywords
- X-RAY-DIFFRACTION; SAPPHIRE
- ISSN
- 0261-8028
- Article Type
- Article
- Citation
- JOURNAL OF MATERIALS SCIENCE LETTERS, vol. 16, no. 17, page. 1457 - 1459, 1997-09-01
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Related Researcher
- 구양모KOO, YANG MO
- Ferrous & Energy Materials Technology