A structural characterization of AlN thin film deposited on a single crystal Al2O3(0001) substrate
SCIE
SCOPUS
- Title
- A structural characterization of AlN thin film deposited on a single crystal Al2O3(0001) substrate
- Authors
- Kim, KH; Chang, CH; Koo, YM
- Date Issued
- 1997-09-01
- Publisher
- CHAPMAN HALL LTD
- Keywords
- X-RAY-DIFFRACTION; SAPPHIRE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/29216
- DOI
- 10.1023/A:1018542217877
- ISSN
- 0261-8028
- Article Type
- Article
- Citation
- JOURNAL OF MATERIALS SCIENCE LETTERS, vol. 16, no. 17, page. 1457 - 1459, 1997-09-01
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- There are no files associated with this item.
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