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Cited 8 time in webofscience Cited 13 time in scopus
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A Bayesian approach to prediction of system failure rates by criticalities under event trees SCIE SCOPUS

Title
A Bayesian approach to prediction of system failure rates by criticalities under event trees
Authors
Jun, CHChang, SYHong, YYang, H
Date Issued
1999-04-20
Publisher
ELSEVIER SCIENCE BV
Abstract
A Bayesian approach under a binary multi-stage event tree is proposed in estimating the system failure rate in various levels of criticality in order to incorporate failure data in one level into analyzing failure rates in any other levels. An initial failure which occurs according to a Poisson process with unknown rate is to escalate to more severe failures depending on functioning states of backup subsystems associated with the event tree. We employ the Gamma prior distribution for the initial failure rate and the Beta priors for the criticality probabilities. An approximation method is proposed to obtain the posterior distributions of the failure rates by criticalities. (C) 1999 Elsevier Science B.V. All rights reserved.
Keywords
event tree; failure rate; backup system; criticality level; Gamma prior
URI
https://oasis.postech.ac.kr/handle/2014.oak/28837
DOI
10.1016/S0925-5273(98)00135-2
ISSN
0925-5273
Article Type
Article
Citation
INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS, vol. 21916, page. 623 - 628, 1999-04-20
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전치혁JUN, CHI HYUCK
Dept of Industrial & Management Enginrg
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