Computer Simulation of Phase-Contrast Images in White Synchrotron Radiation Using Micropipes in Silicon Carbide
SCIE
SCOPUS
- Title
- Computer Simulation of Phase-Contrast Images in White Synchrotron Radiation Using Micropipes in Silicon Carbide
- Authors
- Argunova, TS; Kohn, VG; Je, JH
- Date Issued
- 2008-12
- Publisher
- MAIK NAUKA/INTERPERIODICA/SPRINGER
- Abstract
- A method of computer simulation of phase-contrast images in white synchrotron radiation has been developed to determine the section parameters of micropipes in silicon carbide. The experiments have been carried out using the third-generation synchrotron radiation source the Pohang Light Source (South Korea). The effective spectrum of the synchrotron radiation that forms of an image has been shown to have a relatively sharp maximum at an energy of 16 keV, which makes it possible to conserve coherency within the required limits. A computer program has been developed that automatically determines the diameters of an elliptic section of a micropipe from the condition of coincidence of calculated and experimental profiles. It has been shown that the studied micropipes have a strongly stretched elliptic section that can twist when moving along the pipe axis.
- Keywords
- SCREW DISLOCATIONS; RAY; GROWTH
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/28598
- DOI
- 10.1134/S1027451008060062
- ISSN
- 1027-4510
- Article Type
- Article
- Citation
- JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES, vol. 2, no. 6, page. 861 - 865, 2008-12
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