A crystallographic investigation of GaN nanostructures by reciprocal space mapping in a grazing incidence geometry
- Title
- A crystallographic investigation of GaN nanostructures by reciprocal space mapping in a grazing incidence geometry
- Authors
- LEE, S; SOHN, Y; KIM, C; LEE, DR; LEE, HH; null
- Date Issued
- 2009-05
- Publisher
- IOP PUBLISHING LTD
- Abstract
- Reciprocal space mapping with a two-dimensional (2D) area detector in a grazing incidence geometry was applied to determine crystallographic orientations of GaN nanostructures epitaxially grown on a sapphire substrate. By using both unprojected and projected reciprocal space mapping with a proper coordinate transformation, the crystallographic orientations of GaN nanostructures with respect to that of a substrate were unambiguously determined. In particular, the legs of multipods in the wurtzite phase were found to preferentially nucleate on the sides of tetrahedral cores in the zinc blende phase.
- Keywords
- NANOCRYSTALS; NANOPARTICLES; GROWTH
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/28327
- DOI
- 10.1088/0957-4484/20
- ISSN
- 0957-4484
- Article Type
- Article
- Files in This Item:
- There are no files associated with this item.
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