1ST STAGE IN THE DEVELOPMENT OF A SOFT-X-RAY REFLECTION IMAGING MICROSCOPE IN THE SCHWARZSCHILD CONFIGURATION USING A SOFT-X-RAY LASER AT 18.2 NM
SCIE
- Title
- 1ST STAGE IN THE DEVELOPMENT OF A SOFT-X-RAY REFLECTION IMAGING MICROSCOPE IN THE SCHWARZSCHILD CONFIGURATION USING A SOFT-X-RAY LASER AT 18.2 NM
- Authors
- DICICCO, DS; KIM, D; ROSSER, R; SUCKEWER, S
- Date Issued
- 1992-01-15
- Publisher
- OPTICAL SOC AMER
- Abstract
- We present results that demonstrate the proof of principle of a soft-x-ray reflection imaging microscope in the Schwarzschild configuration. A soft-x-ray laser operating at 18.2 nm was used as the x-ray source. Mo/Si multilayer mirrors with a normal-incidence reflectivity of approximately 20% per surface at 18.2-nm wavelength were used in the Schwarzschild objective.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/28025
- DOI
- 10.1364/OL.17.000157
- ISSN
- 0146-9592
- Article Type
- Article
- Citation
- OPTICS LETTERS, vol. 17, no. 2, page. 157 - 159, 1992-01-15
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- There are no files associated with this item.
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