Open Access System for Information Sharing

Login Library

 

Article
Cited 48 time in webofscience Cited 0 time in scopus
Metadata Downloads

1ST STAGE IN THE DEVELOPMENT OF A SOFT-X-RAY REFLECTION IMAGING MICROSCOPE IN THE SCHWARZSCHILD CONFIGURATION USING A SOFT-X-RAY LASER AT 18.2 NM SCIE

Title
1ST STAGE IN THE DEVELOPMENT OF A SOFT-X-RAY REFLECTION IMAGING MICROSCOPE IN THE SCHWARZSCHILD CONFIGURATION USING A SOFT-X-RAY LASER AT 18.2 NM
Authors
DICICCO, DSKIM, DROSSER, RSUCKEWER, S
Date Issued
1992-01-15
Publisher
OPTICAL SOC AMER
Abstract
We present results that demonstrate the proof of principle of a soft-x-ray reflection imaging microscope in the Schwarzschild configuration. A soft-x-ray laser operating at 18.2 nm was used as the x-ray source. Mo/Si multilayer mirrors with a normal-incidence reflectivity of approximately 20% per surface at 18.2-nm wavelength were used in the Schwarzschild objective.
URI
https://oasis.postech.ac.kr/handle/2014.oak/28025
DOI
10.1364/OL.17.000157
ISSN
0146-9592
Article Type
Article
Citation
OPTICS LETTERS, vol. 17, no. 2, page. 157 - 159, 1992-01-15
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Views & Downloads

Browse