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MICROWAVE PROPERTIES OF FREESTANDING DIELECTRIC FILMS SCIE SCOPUS

Title
MICROWAVE PROPERTIES OF FREESTANDING DIELECTRIC FILMS
Authors
ROBERTSON, WMARJAVALINGAM, GHOUGHAM, GKOPCSAY, GVEDELSTEIN, DREE, MHCHAPPLESOKOL, JD
Date Issued
1992-01-02
Publisher
IEE-INST ELEC ENG
Abstract
Measurement of the broadband (15-150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (approximately 200-mu-m thick) polymer films are presented.
URI
https://oasis.postech.ac.kr/handle/2014.oak/27916
DOI
10.1049/el:19920039
ISSN
0013-5194
Article Type
Article
Citation
ELECTRONICS LETTERS, vol. 28, no. 1, page. 62 - 63, 1992-01-02
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이문호REE, MOONHOR
Dept of Chemistry
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