MICROWAVE PROPERTIES OF FREESTANDING DIELECTRIC FILMS
SCIE
SCOPUS
- Title
- MICROWAVE PROPERTIES OF FREESTANDING DIELECTRIC FILMS
- Authors
- ROBERTSON, WM; ARJAVALINGAM, G; HOUGHAM, G; KOPCSAY, GV; EDELSTEIN, D; REE, MH; CHAPPLESOKOL, JD
- Date Issued
- 1992-01-02
- Publisher
- IEE-INST ELEC ENG
- Abstract
- Measurement of the broadband (15-150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (approximately 200-mu-m thick) polymer films are presented.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/27916
- DOI
- 10.1049/el:19920039
- ISSN
- 0013-5194
- Article Type
- Article
- Citation
- ELECTRONICS LETTERS, vol. 28, no. 1, page. 62 - 63, 1992-01-02
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- There are no files associated with this item.
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