Structural and electrical properties of ZnO nanorods and Ti buffer layers
- Title
- Structural and electrical properties of ZnO nanorods and Ti buffer layers
- Authors
- Kwak, CH; Kim, BH; Park, CI; Seo, SY; Kim, SH; Han, SW; null
- Date Issued
- 2010-02
- Publisher
- AMER INST PHYSICS
- Abstract
- Vertically-well-aligned ZnO nanorods were synthesized on Ti buffer layers by a metal-organic chemical-vapor deposition process. Structural analyses demonstrated that the ZnO nanorods were well-aligned in the c-axis and ab-plane. Transmission electron microscopy (TEM) showed that the Ti buffer layer was amorphous and interdiffused into the ZnO nanorods. Energy-dispersive spectroscopy (EDS) analysis revealed the Ti buffer layers to be slightly oxide. Extended x-ray absorption fine structure confirmed the TEM and EDS results. The I-V characteristic measurements showed a 20-fold increase in current density with the Ti buffer layer, suggesting excellent electrical contact between the Ti buffer layer and ZnO nanorods.
- Keywords
- buffer layers; current density; electrical contacts; EXAFS; II-VI semiconductors; MOCVD; titanium; transmission electron microscopy; X-ray chemical analysis; zinc compounds; GROWTH; ARRAYS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/27523
- DOI
- 10.1063/1.3308498
- ISSN
- 0003-6951
- Article Type
- Article
- Files in This Item:
- There are no files associated with this item.
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