Terahertz Near-Field Microscope: Analysis and Measurements of Scattering Signals
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SCOPUS
- Title
- Terahertz Near-Field Microscope: Analysis and Measurements of Scattering Signals
- Authors
- Moon, K; Jung, E; Lim, M; Do, Y; Han, H
- Date Issued
- 2011-09
- Publisher
- IEEE
- Abstract
- We present the analysis and measurements of scattering signals of a terahertz pulse scattering-type near-field microscope. We used a self-consistent line dipole image method for the quantitative analysis of the THz near-field interaction. The line scan across a gold film demonstrated that the terahertz miscroscope has a nanoscale resolution of similar to 80 nm. The measurements of scattering signals on gold and silicon substrates were in good agreement with calculations.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/27500
- DOI
- 10.1109/TTHZ.2011.2159876
- ISSN
- 2156-342X
- Article Type
- Article
- Citation
- IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, vol. 1, no. 1, page. 164 - 168, 2011-09
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