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Effects of H2 plasma and annealing on atomic-layer-deposited Al2O3 films and Al/Al2O3/Si structures

Title
Effects of H2 plasma and annealing on atomic-layer-deposited Al2O3 films and Al/Al2O3/Si structures
Authors
Kyeong-Keun ChoiJong KeeChan-Gyung ParkDeok-kee Kim박찬경
Date Issued
2015-03
Publisher
The Japan Society of Applied Physics
URI
https://oasis.postech.ac.kr/handle/2014.oak/27112
DOI
10.7567/APEX.8.045801
ISSN
1882-0778
Article Type
Article
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