Direct Observation of Interfacial Morphology in Poly(3-hexylthiophene) Transistors: Relationship between Grain Boundary and Field-Effect Mobility
SCIE
SCOPUS
- Title
- Direct Observation of Interfacial Morphology in Poly(3-hexylthiophene) Transistors: Relationship between Grain Boundary and Field-Effect Mobility
- Authors
- Choi, D; Jin, S; Lee, Y; Kim, SH; Chung, DS; Hong, K; Yang, C; Jung, J; Kim, JK; Ree, M; Park, CE
- Date Issued
- 2010-01
- Publisher
- AMER CHEMICAL SOC
- Abstract
- We investigated the effects of microstructural (crystallization and molecular orientation) and morphological alternation (grain boundary) of poly(3-hexylthiophene) (P3HT) films on the field-effect mobility (mu) before (as-spun P3HT) and after (melt-crystallized P3HT) melting of P3HT films. Although grazing incidence X-ray scattering shows that melt-crystallized P3HT has a more highly ordered edge-on structure than as-spun P3HT, the melt-crystallized P3HT reveals mu = 0.003 cm(2) V-1 s(-1): this is an order of magnitude lower than that of as-spun P3HT (mu = 0.01 cm(2) V-1 s(-1)). In addition, the interfacial morphologies of the bottom surfaces of P3HT films, which are attached to the gate dielectric, were investigated using a him transfer technique. The melt-crystallized P3HT at this interface consists of well-developed nanowire crystallites with well-defined grain boundaries that act as trap states, as verified by analysis of the temperature-dependence of mu. The remarkable reduction of mu in low-molecular-weight P3HT film (8 kg/mol) that results from melt-crystallization is due to the increased number of well-defined grain boundaries.
- Keywords
- P3HT; melt-crystallization; interfacial morphology; field-effect mobility; grain boundary; THIN-FILM TRANSISTORS; X-RAY-SCATTERING; REGIOREGULAR POLY(3-HEXYLTHIOPHENE); CARRIER MOBILITY; MOLECULAR-WEIGHT; POLYTHIOPHENE; DEPENDENCE; TEMPERATURE; TRANSPORT; POLYMERS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/26477
- DOI
- 10.1021/AM9005385
- ISSN
- 1944-8244
- Article Type
- Article
- Citation
- ACS APPLIED MATERIALS & INTERFACES, vol. 2, no. 1, page. 48 - 53, 2010-01
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- There are no files associated with this item.
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