A New Control Scheme Always Better Than X-Bar Chart
SCIE
SCOPUS
- Title
- A New Control Scheme Always Better Than X-Bar Chart
- Authors
- Lee, SH; Jun, CH
- Date Issued
- 2010-01
- Publisher
- TAYLOR & FRANCIS INC
- Abstract
- A new control scheme is proposed by borrowing the idea of the Benjamini-Hochberg procedure for controlling the false discovery rate in multiple testing. It is shown theoretically that the proposed 2-span control scheme outperforms the Shewhart X-bar chart in terms of the average run length under any size of mean shifts. Some simulations are carried out to demonstrate that the proposed scheme having various span sizes always outperforms the X-bar chart in terms of the average run lengths.
- Keywords
- Average run length; Mean shift; Multiple testing; P-value; Quality control; DISTRIBUTIONS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/25391
- DOI
- 10.1080/03610920903243744
- ISSN
- 0361-0926
- Article Type
- Article
- Citation
- COMMUNICATIONS IN STATISTICS-THEORY AND METHODS, vol. 39, no. 19, page. 3492 - 3503, 2010-01
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- There are no files associated with this item.
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