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A Micro-Pull-Off Test Machine for Reliable Measurement of Adhesive Forces on Micro/Nano-Scale Areas SCIE SCOPUS

Title
A Micro-Pull-Off Test Machine for Reliable Measurement of Adhesive Forces on Micro/Nano-Scale Areas
Authors
Kim, SMoon, W
Date Issued
2011-01
Publisher
TAYLOR & FRANCIS LTD
Abstract
In this study, a micro-pull-off testing machine is developed for reliable measurement of the adhesive force on micro-and nano-scale contact areas. The measuring scheme and working principle of the equipment are based on a reliable measurement technique that uses a commercial atomic force microscope (AFM). Adhesive-force-only measuring equipment is manufactured to overcome the inherent limitations of commercial AFMs, and an adhesive force map with a 1-mu m interval is obtained around a micro-machined pattern of radius 2.25 mu m. Use of the proposed technique and equipment could reduce deviations of the measured bond strength of an adhesive protein compared with those we have previously reported. Moreover, the proposed technique and equipment could be further developed to measure the binding force of even a single molecule if a nano-scale pattern is fabricated.
Keywords
Adhesive force measurement; Adhesive protein; AFM; Atomic force microscopy; Force map; Micro-pull-off testing
URI
https://oasis.postech.ac.kr/handle/2014.oak/25070
DOI
10.1080/00218464.2011.545336
ISSN
0021-8464
Article Type
Article
Citation
JOURNAL OF ADHESION, vol. 87, no. 2, page. 139 - 153, 2011-01
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문원규MOON, WON KYU
Dept of Mechanical Enginrg
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