Electroreflectance study of Zn0.8Mg0.20/ZnO nanorod heterostructures
SCIE
SCOPUS
KCI
- Title
- Electroreflectance study of Zn0.8Mg0.20/ZnO nanorod heterostructures
- Authors
- Kim, SS; Lim, HJ; Cheong, H; Park, WI; Yi, GC
- Date Issued
- 2005-06
- Publisher
- KOREAN PHYSICAL SOC
- Abstract
- ZnO, due to its large exciton binding energy which enables excitonic recombination at room temperature, is attracting much attention as a material for room-temperature UV devices. In particular, ZnO nanorod has attracted a great deal of attention because of the commercial interest in short-wavelength semiconductor laser diodes and nanometer-scale electronic devices. Zn0.8Mg0.2O/ZnO nanorod heterostructures were grown by metal-organic vapor-phase epitaxy on catalyst-free ZnO nanorods. Electro reflectance measurements were carried out at temperatures between 90 K and 295 K and compared with photoluminescence data. Quantum confinement effects in Zn0.8Mg0.2O/ZnO nanorod heterostructures were observed.
- Keywords
- zinc oxide; nanorod; heterostructure; electroreflectance; PHASE EPITAXIAL-GROWTH; THIN-FILMS; ROOM-TEMPERATURE; ZNO
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/24492
- ISSN
- 0374-4884
- Article Type
- Article
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 46, page. S214 - S217, 2005-06
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