Application of x-ray nonlinear processes to the measurement of 10 fs to sub-ps of x-ray pulses
SCIE
SCOPUS
- Title
- Application of x-ray nonlinear processes to the measurement of 10 fs to sub-ps of x-ray pulses
- Authors
- Moribayashi, K; Kagawa, T; Kim, DE
- Date Issued
- 2005-07-14
- Publisher
- IOP PUBLISHING LTD
- Abstract
- We study the measurement of pulses of short-pulse x-ray sources through multi-x-ray absorption processes, that is, x-ray nonlinear optical processes and the effect of the lifetime of the inner-shell excited states on the measurement theoretically. The x-ray pulses may be measured by an auto-correlation method, that is, by using double x-ray pulses and the x-ray emission from a multi-inner-shell excited state which has an intermediate state with a much shorter lifetime than the x-ray pulse. The necessary atomic data for the measurement are discussed and shown.
- Keywords
- RADIATION; DYNAMICS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/24458
- DOI
- 10.1088/0953-4075/38/13/011
- ISSN
- 0953-4075
- Article Type
- Article
- Citation
- JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, vol. 38, no. 13, page. 2187 - 2194, 2005-07-14
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- There are no files associated with this item.
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