Two-dimensional mapping of triaxial strain fields in a multiferroic BiFeO3 thin film using scanning x-ray microdiffraction
SCIE
SCOPUS
- Title
- Two-dimensional mapping of triaxial strain fields in a multiferroic BiFeO3 thin film using scanning x-ray microdiffraction
- Authors
- Bark, CW; Cho, KC; Koo, YM; Tamura, N; Ryu, S; Jang, HM
- Date Issued
- 2007-03-05
- Publisher
- AMER INST PHYSICS
- Abstract
- The dramatically enhanced polarizations and saturation magnetizations observed in the epitaxially constrained BiFeO3 (BFO) thin films with their pronounced grain-orientation dependence have attracted much attention and are attributed largely to the constrained in-plane strain. Thus, it is highly desirable to directly obtain information on the two-dimensional (2D) distribution of the in-plane strain and its correlation with the grain orientation of each corresponding microregion. Here the authors report a 2D quantitative mapping of the grain orientation and the local triaxial strain field in a 250 nm thick multiferroic BFO film using a synchrotron x-ray microdiffraction technique. This direct scanning measurement demonstrates that the deviatoric component of the in-plane strain tensor is between 5x10(-3) and 6x10(-3) and that the local triaxial strain is fairly well correlated with the grain orientation in that particular region. (c) 2007 American Institute of Physics.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/23529
- DOI
- 10.1063/1.2711530
- ISSN
- 0003-6951
- Article Type
- Article
- Citation
- APPLIED PHYSICS LETTERS, vol. 90, no. 10, 2007-03-05
- Files in This Item:
-
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.