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White X-ray beam topography and radiography of Si1-xGex crystals bonded to silicon

Title
White X-ray beam topography and radiography of Si1-xGex crystals bonded to silicon
Authors
Argunova, TSYi, JMJung, JWJe, JHSorokin, LMGutkin, MYBelyakova, EIKostina, LSZabrodskii, AGAbrosimov, NV
POSTECH Authors
Je, JH
Date Issued
Jan-2007
Publisher
WILEY-V C H VERLAG GMBH
URI
http://oasis.postech.ac.kr/handle/2014.oak/23200
DOI
10.1002/PSSA.2006756
ISSN
0031-8965
Article Type
Article
Citation
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, vol. 204, no. 8, page. 2669 - 2674, 2007-01
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제정호JE, JUNG HO
Dept of Materials Science & Enginrg
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