Defects in strained epitaxial SrRuO3 films on STiO3 substrates
SCIE
SCOPUS
- Title
- Defects in strained epitaxial SrRuO3 films on STiO3 substrates
- Authors
- Oh, SH; Suh, JH; Park, CG
- Date Issued
- 2007-10
- Publisher
- JAPAN INST METALS
- Abstract
- Transmission electron microscopy (TEM) analyses of the defects formed in epitaxial SrRuO3 films on SrTiO3 (001) substrates are reported. With preparing three different forms of TEM specimens, i.e. plan-view, cross-sectional and free-standing specimens, various TEM techniques were implemented with placing emphasis on the effect of misfit strain on the defect formation. With in-situ TEM heating observations, the present TEM results provide insights into the formation mechanism of misfit dislocations, the occurrence of anti-phase boundary ribbons near the misfit dislocations, and the structural phase transitions of epitaxial perovskite films.
- Keywords
- transmission electron microscopy; strontium ruthenium oxide; misfit dislocation; anti-phase boundary; orthorhombic domain; THIN-FILMS; SRTIO3; DISLOCATIONS; SURFACE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/23066
- DOI
- 10.2320/matertrans.MD200713
- ISSN
- 1345-9678
- Article Type
- Article
- Citation
- MATERIALS TRANSACTIONS, vol. 48, no. 10, page. 2556 - 2562, 2007-10
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