Polystyrene-b-polyisoprene thin films with hexagonally perforated layer structure: quantitative grazing-incidence X-ray scattering analysis
SCIE
SCOPUS
- Title
- Polystyrene-b-polyisoprene thin films with hexagonally perforated layer structure: quantitative grazing-incidence X-ray scattering analysis
- Authors
- Heo, KY; Yoon, JW; Jin, SW; Kim, JH; Kim, KW; Shin, TJ; Chung, BH; Chang, TY; Ree, MH
- Date Issued
- 2008-04
- Publisher
- BLACKWELL PUBLISHING
- Abstract
- Grazing-incidence X-ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures with ABC and AB stacking sequences were derived, and used in the quantitative analysis of the two-dimensional GIXS patterns of polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer thin films supported on silicon substrates. This quantitative analysis provided detailed information ( shape, size and size distribution, packing order, layer packing sequence, and orientation) about the HPL structure of the diblock copolymer films that cannot be easily obtained with conventional X-ray and neutron scattering techniques or with conventional microscopic methods.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/22871
- DOI
- 10.1107/S00218898080
- ISSN
- 0021-8898
- Article Type
- Article
- Citation
- JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 41, page. 281 - 291, 2008-04
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