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Exafs and dilatometric analysis of structural rearrangement after annealing in a Zr-based bulk metallic glass SCIE SCOPUS

Title
Exafs and dilatometric analysis of structural rearrangement after annealing in a Zr-based bulk metallic glass
Authors
Lee, KSEckert, JChang, YW
Date Issued
2008-05
Publisher
INST PROBLEMS MECHANICAL ENGINEERING-
Abstract
The atomic-scale structural rearrangement of a Zr-41.2 Ti13.8Cu12.5 Ni10Be22.5 bulk metallic glass has been investigated in relation to the duration of annealing time at 430 degrees C by applying both dilatometric measurements and extended X-ray absorption fine structure (EXAFS) spectroscopy. The phase-shifted distance between first shells of Zr atoms (R-P) was 2.95 angstrom by EXAFS and the average nearest-neighbor distance r(0) calculated from dilatometry was 3.2 angstrom. From the results, the progress of structural relaxation caused by the annihilation of free volume could be revealed as the annealing time increases.
Keywords
EFFECTIVE PAIR POTENTIALS; UNDERCOOLED LIQUID-STATE; DEFORMATION-BEHAVIOR; AMORPHOUS-ALLOYS; CRYSTALLIZATION; TRANSITION; PHASE
URI
https://oasis.postech.ac.kr/handle/2014.oak/22731
ISSN
1606-5131
Article Type
Article
Citation
REVIEWS ON ADVANCED MATERIALS SCIENCE, vol. 18, no. 1, page. 14 - 17, 2008-05
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